RAKON: High Reliability Radiation Tolerant COTS
- Posted by Manuel Padial Pérez
- On August 15, 2020
- 0
XOs RK105 and VCXOs RK205 products specifically designed for New Space applications, have the following characteristics:
| wdt_ID | Series | Dimensions | Logic type | Frequency | Stability (FVST) |
|---|---|---|---|---|---|
| 1 | RK105 XO | 5.0 x 3.2 x 1.2 mm | CMOS, LVDS, LVPECL | 8 - 1500 MHz | ±30 ppm: -40 to 85°C, ±50 ppm: -55 to 125°C |
| 25 | RK205 VCXO | 5.0 x 3.2 x 1.2 mm | CMOS, LVDS, LVPECL | 8 - 1500 MHz | ±30 ppm: -40 to 85°C, ±50 ppm: -55 to 125°C |
1) Operating temperature:
- Option I: -40°C to 85°C
- Option M: -55°C to 125°C
2) Hermetically sealed package
3) Different screening options (100%)
| wdt_ID | Screening Operation | Requirements and Condition | EM | FM0 | FM1 | FM2 |
|---|---|---|---|---|---|---|
| 1 | Stabilization bake (prior to seal) | MIL-STD-883 method 1008, condition C | N/A | 24h@150°C | 24h@150°C | 24h@150°C |
| 4 | Thermal shocks | MIL-STD-883, method 1011, condition A | N/A | |||
| 7 | Temperature cycling | MIL-STD-883, method 1010, condition B | N/A | |||
| 10 | Constant acceleration | MIL-STD-883, method 1010, condition A Acceleration: 5000g, curing 60s in direction Y1 | N/A | |||
| 13 | PIND test | MIL-STD-883, method 2020, condition B | ||||
| 16 | Seal test | Fine leak: MIL-STD-883, method 1014, condition A2 Gross leak: CEI 68-2-17 Test Qc, Method 1 | ||||
| 19 | Pre burn-in measurement | Following the guidelines of MIL-PRF-55310, §4.8.5, §4.8.6, §4.8.11, and §4.8.20 | Note 1 | Note 2 | Note 2 | |
| 22 | Burn-in | Temperature: +125°C; Pressure: Patm Supply; Voltage: Vcc nom; Load: Load nom | N/A | N/A | 160h min. | 160h min. |
| 25 | Post burn-in measurement | Following the guidelines of MIL-PRF-55310 | N/A | N/A | ||
| 28 | PDA | Following the guidelines of MIL-PRF-55310 | N/A | N/A | 20% | 10% |
Note 1: Electrical verification.
Note 2:
- MIL-STD-105E general inspection level, AQL level 1.0.
- 100 pcs batch: test on 13 pcs / 0 rejected.
- 500 pcs batch: test on 20 pcs / 0 reject accepted.
- 1000 pcs batch: test on 50 pcs / 1 reject accepted.
4) Products have been radiation tested up to the following levels without any events
wdt_ID Values TID (LDR as per ESCC22900) SEL (MeV/mg/cm2) SET (MeV/mg/cm2) SEFI (MeV/mg/cm2)
1
CMOS
100 kRad
32.4
20
62.5
4
LVDS
72 kRad
32.4
10
62.5
7
LVPECL
72 kRad
62.5
10
62.5
Since 2000 in Alter Technology, as EEE Parts Engineer, first in the Engineering and Materials Management Department, has given technical support to customers in many different space programmes. And later on, as Coordinator of the Parts Engineering and Purchasing Department, has been in charge of guarantee the proper EEE Parts selection/definition/testing to ensure the technical/schedule/budget compliance to projects requirements. Currently and since 2017 is leading the Technical Content Maintenance Team of doEEEt platform.
With the continuous maintenance of the platform technical content, doEEEt provides to the space community the most updated and complete information about Hi-Rel EEE components, related documentation, and reports, as well as any associated procurement and testing activities.
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