Varistors for Automotive Ethernet
doEEEt Media Group

Varistors for Automotive Ethernet

doEEEt Media Group
May 4, 2021
0
AVX Varistors AVX began shipping a selection of multi-layer varistors (MLV) in 1988 and entered the automotive supply chain in 2001. AVX has adopted bismuth oxide (Bi2O3)-based construction for its h...
PCB Antenna Design Explained
doEEEt Media Group

PCB Antenna Design Explained

doEEEt Media Group
May 3, 2021
0
Do you know how a PCB antenna works? In this video Robert Feranec, John Dunn, John Carney, and Cadence will guide you through its design, features and explain its basics.
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Testing Methods EEE Parts

MLCC

How to determine and measure MLCC ripple current and ESR

doEEEt Media Group
December 16, 2019
0
The video shows how Kemet’s KC-LINK capacitors are tested for ripple current rating and ESR. These surface mount capacitors are designed to meet the growing demand for fast-switching wide bandgap (WBG) semiconductors that operate at higher voltages, temperatures, and frequencies.
current limiting ic´s

Current limiting IC’s for Space Applications

José Francisco Largaespada
December 25, 2020
0
Current limiting is a basic block element of any power supply. Many electronic devices are powered almost 100% of the time and are usually unattended, and therefore safety methods like current limit devices are essential to protect and improve the good performance of the equipment. In this sense, current protection is even more important in space applications, not only because of the criticality of the missions and the unavailability of repair but also because the possibility of Single Event Latch-up
Degolding and Retinning

How are the degolding and rettinning processes in EEE parts done

Aintzane Lujambio Genua
October 27, 2020
0
The procurement, evaluation, screening and lot acceptance of RF devices in leadless SMD packages to be used in spacecraft applications show unexpected difficulties whenever de-golding or retinning processes are required. This is associated to the induced lack of coplanarity in the contacts after those.
C-Sam-internal-inspection-

SAM Capabilities, Analyse the internal structure in EEE Parts

Francisco Javier Aparicio Rebollo
February 24, 2021
0
In acoustic microscopy, resolution and inspection depth is an inversely related parameter that depends on the probe frequency and the characteristics of the involved materials. Therefore, the inspection frequency must be carefully selected in order to optimize the accuracy without decreasing the inspection depth below the specimen thickness. Suitable selection of the inspection parameters provides: Detection of ultra-thin (submicrometric) delamination in multilayer systems. Micrometric lateral resolution. In acoustic microscopy, resolution and inspection depth is an inversely related parameter that depends on the probe frequency and the characteristics of the involved materials.
SMD Power Inductors

SMD Power Inductors

doEEEt Media Group
January 2, 2020
0
There are a multitude of SMD Power Inductors construction types available for the different types of application: Magnetically shielded and Unshielded
PBC C-SAM

What is a C-SAM Inspection?

Francisco Javier Aparicio Rebollo
March 29, 2019
0
Internal (invisible) fabrication and materials defects can critically compromise the performance of encapsulated microelectronics parts. Similarly, accidental constructional failures (missing parts) and counterfeit suppose and non-negligible issue in the current EEE market.
Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

David Ramirez - Cruzado
November 6, 2020
0
The aim of this destructive test is to demonstrate that the internal materials, design, construction, and assembly of EEE parts are in accordance with the applicable acquisition document. This test can also be performed to examine unsealed devices prior to capping to verify that no damage and/or defects have appeared as a result of prior testing (see Pre-cap Inspection).

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