EEE Components, INSPECTION, ELECTRICAL & VERIFICATION, PASSIVES, PHYSICAL, MECHANICAL & ASSEMBLY, SPECIFICATIONS / QPLs, TESTING

Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Posted by doEEEt Media Group
On October 14, 2019
0

Guidelines for Selection of Ceramic Capacitors for Space Applications: Cracking Problems in Low-Voltage Chip Ceramic Capacitors

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

High Rel Principles and Verifications in Solid Tantalum Capacitors

Posted by Kemet Electronic Corporation
On October 2, 2019
0

Typical short circuit failure mode in Tantalum capacitors can lead to significant damage to the adjacent circuit board, and 50%voltage de-rating alone is not sufficient to address this problem.

EEE Components, PASSIVES

Get the lowdown on shelf life and capacitors storage

Posted by doEEEt Media Group
On August 9, 2019
0

Electrical characteristics of stored capacitors change mainly depending on storage conditions, especially temperature and humidity.

EEE Components, MANUFACTURER NOTIFICATION, PASSIVES

Mini Systems Thin Film Division Will Use PECVD Process

Posted by Manuel Padial Pérez
On July 31, 2019
0

The Product/Process Change Notification (PCN) #19-001 informs about the changes in the deposition method of dielectric material, silicon dioxide, used as a protective glassivation layer over thin-film resistors

ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Know all the characteristics of a HAST test?

Posted by Álvaro Ricca Soaje
On February 21, 2019
0

HAST test reduces the time it takes to complete the typical humidity 85 ºC / 85% RH testing for semiconductors (96 HAST hours are equivalent to 1000 THB hours). By elevating temperatures above 100°C (usually up to 130°C) and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms.

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