Voids on sealing area.

  • Posted by Pedro CARABIAS LÓPEZ
  • On February 10, 2020
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Preliminary observation during the External Visual inspection about possible sealing area defects is not enough to confirm the fault. Additional criteria are provided in this post

Satellite SAOCOM 1A

  • Posted by doEEEt Media Group
  • On February 6, 2020
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The satellite SAOCOM 1A, is the first of two identical satellites where it covers the development of active instruments operating in the microwave range.

JUICE Jupiter Icy Moons Explorer

  • Posted by Israel Pedroche
  • On February 4, 2020
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    • 1 likes
JUpiter ICy Moons Explorer (JUICE) is a spacecraft designed by Airbus Defence and Space for the European Space Agency (ESA) mission to fly the Jovian system. It is the first Large-class mission in ESA’s Cosmic Vision 2015–2025 programme.

Phases of Evaluation and Qualification in Electronic Components

  • Posted by Manuel Padial Pérez
  • On February 2, 2020
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    • 3 likes
During the Evaluation phase, components/technologies can be expensively characterized and margins determined. If the evaluation is successful we can then proceed with Qualification, on components produced strictly as defined in the final PID (Process Identification Document) and from a given lot (actually, the first production lot). Once qualified, the component is listed in the QPL (Qualified Part List).

Reliability considerations on Photonics parts for New Space Applications

  • Posted by doEEEt Media Group
  • On January 30, 2020
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    • 1 likes
NewSpace is an approach that focuses on lowering the barriers to entry to space industry, by providing cheaper access to space… One of the major characteristics of the NewSpace era is the fundamental shift from an industry which was heavily dependent on government agencies to a more agile and an independent private sector that relies on innovation, working with much smaller budgets than the early space industry.

Alter Technology SAM Additional Testing Capabilities

  • Posted by Francisco Javier Aparicio Rebollo
  • On January 29, 2020
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    • 2 likes
Among the test flow where SAM microscopy is used, other tests are carried out in which Alter Technology also has extensive experience, giving its customers the possibility of doing all the necessary tests with our expert engineers, offering support and follow-up at all times thanks to Virtual Lab; where immediate access is generated and in real time to all the information on the parts examined.

MICROCHIP FPGAs External Visual Inspection Considerations

  • Posted by Antonio Rodríguez Arenas
  • On January 20, 2020
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One of the quality assurance inspections that are performed in EEE parts is external visual inspection. The applicable method for Microchip FPGAs as well as for other parts with generic specification MIL-PRF-38535, is MIL-STD-883 Method 2009.

Lisa Pathfinder

  • Posted by doEEEt Media Group
  • On January 13, 2020
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LISA Pathfinder is paving the way for future missions by testing in flight the very concept of gravitational wave detection: it will put two test masses in a near-perfect gravitational free-fall and control and measure their motion with unprecedented accuracy.
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