Considering the risk of retinning on QFN package

Posted by Manuel Sánchez Ruiz
On November 25, 2019
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The use of new packages on space market has come hand in hand with the introduction of commercial of the shelf (COTS) parts in the business and even more with the New Space needs.

Open Letter to AEC-Q200 Committee on MLCC DC BIAS Ageing

Posted by doEEEt Media Group
On November 19, 2019
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Over the past years, multi-layer ceramic capacitors have undergone significant improvements. The volumetric density has increased several folds. This unfortunately resulted in a big increase in DC and AC bias sensitivity for many parts.

High CV MLCC DC BIAS and AGEING Capacitance Loss Explained

Posted by doEEEt Media Group
On November 19, 2019
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MLCC capacitors are dominating today’s capacitor market enabling high grade of electronics miniaturization.

MMIC RF Bypassing Capacitor Selection Quick Guide

Posted by doEEEt Media Group
On October 14, 2019
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High-frequency monolithic microwave integrated circuit (MMIC) amplifiers with broadband gain need to be protected from RF noise on the supply lines.

Analysis of Multi-Layer Ceramic Capacitors

Posted by doEEEt Media Group
On October 14, 2019
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This paper presents an overview of MLCCs characteristics that are of interest when used in power integrity (PI) analysis of automotive electronic systems.

Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Posted by doEEEt Media Group
On October 14, 2019
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Guidelines for Selection of Ceramic Capacitors for Space Applications: Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

Posted by José Francisco Largaespada
On October 7, 2019
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What are the typical set of tests included as part of Destructive Physical Analysis (DPA) of EEE Components?

Integrated and Discrete Capacitors Based on Carbon Nanostructures

Posted by doEEEt Media Group
On October 7, 2019
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Complete on-chip fully solid-state 3D integrated capacitors using vertically aligned carbon nanofibers as electrodes to provide a large 3D surface in a MIM configuration have been manufactured and characterized.

How to measure MLCC Capacitance accurately on LCR meters

Posted by Kemet Electronic Corporation
On October 7, 2019
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Some tips to always get the most precise measurement every time

High Rel Principles and Verifications in Solid Tantalum Capacitors

Posted by Kemet Electronic Corporation
On October 2, 2019
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Typical short circuit failure mode in Tantalum capacitors can lead to significant damage to the adjacent circuit board, and 50%voltage de-rating alone is not sufficient to address this problem.

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