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Non-Destructive Detection of Delaminations in PCBs Assemblies

  • Posted by Raquel Irene Cano Cordero
  • On March 10, 2021
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    • 4 likes
Scanning Acoustic Microscopy (C-SAM) inspection has been used for the comprehensive inspection of the lead-frame in a horizontally stacked capacitor. This non-destructive inspection reveals minor anomalies at the interface with capacitor terminals which may impair the electrical response.
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SAM, the preferred method for the non-destructive internal inspection

  • Posted by doEEEt Media Group
  • On December 16, 2020
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    • 2 likes
SAM, The Preferred Method For The Non-Destructive Internal Inspection. Scanning Acoustic Microscopy of COTS and plastic encapsulated microelectronics. Confocal Scanning Acoustic Microscopy (C-SAM) has proved to be the most effective non-destructive approach for the screening of COTS parts and the detection of latent internal anomalies in PEMs, either before soldering or for assembled systems.
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C-SAM Questions & Answers

  • Posted by Francisco Javier Aparicio Rebollo
  • On July 7, 2020
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    • 0 likes
In this post, you can read all the questions launched by the attendees, as well as all the answers offered by the speaker.
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How to protect your COTS parts during C-SAM inspections.

  • Posted by Francisco Javier Aparicio Rebollo
  • On July 7, 2020
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    • 0 likes
The current post describes the different measures taken during Scanning Acoustic Microscopy (SAM) inspection to avoid potentially harmful effects associated with water immersion. Internal visual inspection conducted after decapsulation shows the successful prevention of corrosion phenomena in these samples.
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Scanning Acoustic Microscopy (C-SAM) of in Stacked Capacitors

  • Posted by Francisco Javier Aparicio Rebollo
  • On June 12, 2020
  • 0
    • 1 likes
Scanning Acoustic Microscopy (C-SAM) inspection has been used for the comprehensive inspection of the lead-frame in a horizontally stacked capacitor. This non-destructive inspection reveals minor anomalies at the interface with capacitor terminals which may impair the electrical response.
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Ultrasonic Examination of Ceramic Capacitors by Scanning Acoustic Microscopy

  • Posted by Francisco Javier Aparicio Rebollo
  • On May 18, 2020
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    • 0 likes
Ultrasonic Examination of Ceramic Capacitors by Scanning Acoustic Microscopy (SAM) has proved to be the most effective tool for the non-destructive detection of very thin (even below 200 nm of thickness) internal anomalies (delamination, voids, cracks, and foreign material) within ceramic capacitors and other EEE parts
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