- Posted by doEEEt Media Group
- On December 10, 2020
Alter Technology as reference test house
- Screening of a high number of devices under very harsh conditions: Custom testing setup
- High Temperature: 270ºC
- Low temp: -170ºC
- High Voltage tests: 250V
- High Power tests: 2.5A
Long lasting tests with constant monitoring of electrical parameters and temperature of each single diode.
500h monitoring of reverse biased diodes
More ongoing radiation campaigns to understand the device degradation under heavy ions radiation.
Customer: ESA (European Space Agency)
For more information contact us
- DOWNLOAD NON-STANDARD PDF - September 23, 2021
- SPACE TALKS 7 | Quantum Activities for Space - September 7, 2021
- A Machine Learning Degradation Model for Supercapacitors Operated at High Temperature - August 23, 2021