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ALTER Laboratory Services, INSPECTION, ELECTRICAL & VERIFICATION, Plastic Packaging for Space

Are there Voids in your IC Plastic Molding?

  • Posted by Raquel Cano Cordero
  • On November 10, 2021
  • 0

The new needs of the space market (saving costs, need for modern IC Technology, less lead time, access to the latest technology…) have caused the increase of the COTS use in the last few years. However, the extreme conditions of the space environment (extreme temperatures, radiation, vibration, humidity…) limit their use and require a balance between reliability, quality, screening, and costs.

One of the biggest cons of COTS is the plastic package, which must be analyzed and identified to avoid functional anomalies (electrical or mechanical) that could result in catastrophic errors during their performance. Some of these faults are delaminations (you can find our previous post about this topic here), voids, and cracks.

In this post, we are going to talk about voids, how they are originated and why they are dangerous.

What are voids and how are they originated?

Voids are defined as a lack of material

Voids are defined as a lack of material within the bulk of the molding compound. They are common in ICs since they appear during improper molding manufacturing (injection, extrusion, etc.) and curation. These voids may remain spread out throughout the plastic potting, and their presence is hazardous if they intersect wire bonds, connect two different parts that are meant to be isolated, or touch the die surface. This may affect the mechanical stability of the device and lead to other defects such as cracks.

voids are located in the attach area

Another possibility is that these voids are located in the attached area causing of lack of adhesion, weakening the structure, and making the affected parts more likely to break apart.

Attach Adhesion lack

More about C-SAM

How to analyse the internal structure of the component?

SAM (Scanning Acoustic Microscopy) inspection is a relatively inexpensive and non-destructive method that can detect and identify these voids accurately, being the ideal technique to detect these kinds of anomalies, since X-ray is not sensitive to this kind of defect.

X-ray is not sensitive

In a nutshell, it is a perfect solution for this purpose, but how do these anomalies affect the component?

Added to the ones mentioned above, other failures associated with voids are:

Failure Mechanisms:

  • Poor mechanical stability
  • Wire bond damages (twisting, necking, breakage …)
  • Metal corrosion
  • Cracking or delamination of die or encapsulant

Electrical Failure Modes:

  • Short-circuit / Open-circuit
  • Parametrical failure
  • Impedance increase

CSAM VOIDS

If you want more information or have any questions about C-SAM inspection, please do not hesitate to contact us. We are highly experienced with this technique, and our lab can offer you a service with the latest technology on the market.

Scanning Acoustic Microscopy Services

Contract our CSAM services

One of our experts will be helping you in any process of the project you need

  • Author
  • Recent Posts
Raquel Cano Cordero
Raquel Cano Cordero
Raquel has a Degree in Material Engineering and a Master's Degree in Materials Science from the University of Seville. Master thesis project about "One Dimensional Nanotubes as Highly Sensitive Surface-Enhanced Raman Scattering (SERS) Based Sensors" at the Institute of Materials Science of Seville. She joined Alter Technology as Scanning Acoustic Microscopy Analyst from 2020 to 2022.

Currently, she is not in our company anymore, but is mentioned as an external collaborator in our blog.
Raquel Cano Cordero
Latest posts by Raquel Cano Cordero (see all)
  • Are there Voids in your IC Plastic Molding? - November 10, 2021
  • Thermo-mechanical Analyser – TMA – capabilities - October 5, 2021
  • Thermo-Mechanical Analysis - August 9, 2021
TAGS: COTS EEE PARTS C-SAM NEW SPACE Scanning Acoustic Microscopy - Short Technical Notes

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