- Posted by Francisco Javier Aparicio Rebollo
- On June 17, 2019
Scanning Acoustic Microscopy Service
- A-scan, B-scan, C-scan, and Through-scan
- Circuit, non-circuit, and through-transmitted signal are systematically inspected at different focal depths
- Delamination (phase inversions) is confirmed by A-scan mode
FT data treatment
Full area A-scan records upon request
Read More about SAM Test Flow and Procedures
Senior materials and Test Engineer
Francisco Javier has a Degree in Physics and a Ph.D. in Materials Science both from the University of Seville and has conducted different Post-doctoral stays at the University of Mons (Belgium), University of Trento (Italy) and the Spanish National Research Council.
He works as materials and physical test senior engineer within the Destructive and Physical Analysis Department. In Alter Technology laboratories, his main tasks address the characterization of EEE parts by advanced microscopy techniques and the conception of new test procedures.
Co-authors: David Ramírez-Cruzado Monge; Jose Cándido Vázquez, Dimas Morilla Mairen, Manuel Domínguez Álvarez, Antonio Rodríguez Arenas.