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    • ACCEDE 2022 Workshop on COTS
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    • EVENTS / WEBINARS
    • SPACE TALKS
    • TECH ARTICLES
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  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
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    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
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ACTIVES, EEE Components

Ceramic Hermetic DDR2 SDRAM Memory avalaible for Space

  • Posted by Manuel Padial Pérez
  • On September 13, 2021
  • 0
DDC's 97D2H is a hermetically sealed ceramic DDR2 SDRAM Memory for space and features high-speed operation with up to 8 Gbits of memory. Optional RAD-PAK® shielding provides greater total dose tolerance, to support missions with greater radiation exposure
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ACTIVES, EEE Components

Radiation Tolerant Solid State Drives (SSD)

  • Posted by Manuel Padial Pérez
  • On September 1, 2021
  • 0
Aerospace developers and Space engineers are looking towards non-volatile memories such as NAND flash and solid state drives as alternatives for mass storage in space applications
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Non-standard testing

Characterization of the Image Sensors according to the EMVA 1288 standard and beyond

  • Posted by Pawel Adamiec
  • On July 26, 2021
  • 0
We have developed an EMVA 1288 standard compliant system for characterizing image sensors in a wide wavelength range and developed a low-cost camera to drive different types of image sensor.
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ACTIVES, EEE Components, MANUFACTURER NOTIFICATION

Microchip’s Low-Power Radiation-Tolerant (RT) PolarFire® FPGA Enables High-Bandwidth Space Systems with Lower Total System Cost

  • Posted by Microchip Technology 
  • On July 18, 2021
  • 0
Developers of spacecraft electronics use radiation-tolerant (RT) field programmable gate arrays (FPGAs) to create on-board systems that meet the demanding performance needs of future space missions, survive the brutal launch process and continue to operate reliably in the harsh environment of space
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Optoelectronics Components Testing

Lasers endurance characterization in vacuum conditions

  • Posted by Alejandro López Moya
  • On July 6, 2021
  • 0
Laser diodes characterization can be complex due to the laser’s nature. A good heat dissipation must be provided to avoid lasers being damaged. Unique and challenging equipment is required for a perfect characterization because accuracy is a must with this optical component. The real challenge? The test setup definition and implementation when lasers must be tested in extreme conditions, like vacuum or high/low temperatures.
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ACTIVES, EEE Components

Plastic Rad Tolerant Microchip Products for New Space

  • Posted by Manuel Padial Pérez
  • On February 26, 2021
  • 0
Microchip’s AVR8 ATmegaS64M1/ATmegaS128 and ARM32 M7 SAMV71Q21 Flight Models (FM) are available in ceramic package with screening equivalent to QML class Q and QML class V quality levels. Engineering samples are available as well. Developing radiation-hardened systems for space applications means long lead times and high cost toward achieving the necessary levels of reliability for multi-year missions in harsh environments.
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ACTIVES, EEE Components

Typical Parameters in the Electrical Test of Operational Amplifiers

  • Posted by Sonia Vargas
  • On December 28, 2020
  • 0
In order to evaluate the effects of certain stress sources related to space applications, a set of electrical parameters are measured during the process. Here are presented the typically used ones for operational amplifiers.
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EEE Components, PASSIVES

New Method of Graphene Manufacturing at Scale

  • Posted by doEEEt Media Group
  • On December 8, 2020
  • 0
The hyperbole has seen graphene grandiosely described as a wonder material that is going to find transformative applications across the electronics sector.
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ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

How and Why to Test for Displacement Damage

  • Posted by Manuel Padial Pérez
  • On November 16, 2020
  • 0
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. Displacement damage degrades minority carrier lifetime; a typical effect would be the degradation of gain and leakage current in bipolar transistors.
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ACTIVES, EEE Components

Rad-hard parts available in the market

  • Posted by Javier Alejandro de la Ossa Fernández
  • On November 11, 2020
  • 0
Commercial parts will have TID ranges between 3-30 krad(Si)and SEL and SEU ranges between 1-120 MeV. Of course, commercial parts are not designed with radiation performance in mind. Nevertheless, a few commercial ICs have in fact exhibited acceptable radiation hardened characteristics.
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