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    • EVENTS / WEBINARS
    • SPACE TALKS
    • TECH ARTICLES
    • MANUFACTURERS NOTIFICATIONS
  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
    • SMALL SATS
    • REPRESENTATIVE PROJECTS / PAPERS
  • Additional Services
    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
    • PENETRATION TEST
    • CYBERSECURITY CERTIFIED (CSC)
    • CODE SCORE MATRIX
    • LONG-TERM STORAGE OF WAFERS
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Small Sats Testing

Component Testing for New Space Applications

  • Posted by Enrique Cordero
  • On July 2, 2021
  • 0
This standard describes the differences and the minimum testing requirements necessary to each of these three classes for evaluation, screening, and lot acceptance. The following test sequence shows the evaluation test sequence for class 1 components, this sequence is the same in the three classes described in the standard with different severity and test conditions to each class.
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ACTIVES, COTS, New Space, LEO Constellations, EEE Components

AXTAL: “Space-COTS Crystals” (SCC)

  • Posted by Manuel Padial Pérez
  • On June 25, 2021
  • 2
For New Space applications AXTAL offers as special service the sourcing and/or up-screening of commercial quartz crystal units with proven quality level to so-called "Space-COTS Crystals" (SCC) increasing the range of available package styles
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PHYSICAL, MECHANICAL & ASSEMBLY, TESTING

Why do a PIND test – Particle Impact Noise Detection

  • Posted by Adrián Cembrano Pérez
  • On March 11, 2021
  • 0
PIND ( Particle Impact Noise Detection Test ) testing is performed in order to detect the presence of loose particles inside a device cavity. Loose particle contamination is often caused by dirt, fibers, solder residues and other elements trapped inside the cavity during the sealing process. Loose particles can be a cause of electrical anomalies (or other physical problems) which in their turn can cause abnormal functioning of the parts and affect their reliability.
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ACTIVES, COTS, New Space, LEO Constellations, EEE Components

Q-TECH: RAD TOLERANT for LEO applications

  • Posted by Manuel Padial Pérez
  • On December 25, 2020
  • 0
Produced and tested on the same line as Q-tech most stringent space qualified oscillators, the parts proposed for LEO applications, QT780 SERIES, QT723 SERIES, QT735 SERIES are made with the same Q-Tech quality and reliability
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ACTIVES, COTS, New Space, LEO Constellations, EEE Components

RAKON: High Reliability Radiation Tolerant COTS

  • Posted by Manuel Padial Pérez
  • On August 15, 2020
  • 0
XOs RK105 and VCXOs RK205 products specifically designed for New Space applications, have the following characteristics
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ACTIVES, EEE Components, SPECIFICATIONS / QPLs

Changes to SMDs 5962-12227 and 5962-13207 of MAGNETORESISTIVE RAMs (MRAM)

  • Posted by Manuel Padial Pérez
  • On September 29, 2019
  • 0
STANDARD MICROCIRCUIT DRAWINGS (SMDs) 5962-12227 and 5962-13207 have been recently updated with the inclusion of variants 03 and 04
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ACTIVES, EEE Components, SPECIFICATIONS / QPLs

Review of main changes in generic specification MIL-PRF-55310 REV. F

  • Posted by José Francisco Largaespada
  • On July 19, 2019
  • 0
Space standards (such as ESCC and MIL standards) have helped throughout the years to develop the industry and to achieve de mission goals. Standards improve the competitiveness, efficiency and knowledge transfer within space business. However, standards are not frozen documents, but rather they must change and adapt to the current requirements of the industry and the new developments and knowledge gathered during all the years of space missions.
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