Scanning Acoustic Microscopy - Short Technical Notes
Scanning Acoustic Microscopy (C-SAM) of in Stacked Capacitors
Francisco Javier Aparicio Rebollo
June 12, 2020
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COTS in space: Does delamination really cause critical failures?
Emilio Cano García
April 20, 2022
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Non-destructive detection of micrometric internal features within EEE microelectronic systems.
Francisco Javier Aparicio Rebollo
September 3, 2019
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Advantages of SAM for new space microelectronics inspection
Javier Alejandro de la Ossa Fernández
March 10, 2022
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Inspection of thick EEE plastic encapsulated parts – CSAM Services
Francisco Javier Aparicio Rebollo
June 27, 2019
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Acoustic Inspection of Hybrid Systems on Laminated Substrates
Francisco Javier Aparicio Rebollo
September 3, 2019
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Test combination for detecting defects in plastic ICs
doEEEt Media Group
February 10, 2022
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Scanning Acoustic Microscopy (SAM) and X-Ray Tomography
doEEEt Media Group
April 26, 2022
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