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  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
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    • REPRESENTATIVE PROJECTS / PAPERS
  • Additional Services
    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
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Non-standard testing

Lunar Regolith Test onto COTS Optoelectronics

  • Posted by Juan Moreno Echarri
  • On January 18, 2023
  • 0
Introducing the usage in planetary exploration as illumination of surface in robotic lunar exploration needs new testing techniques. Commercial LEDs are available in many packages, most SMD mounting and, in many cases, finished with a silicone glob top. The degradation caused by lunar regolith exposure onto all these options is unknown and shall be assessed by testing.
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ALTER Laboratory Services, SiC Testing

SiC reliability: Defects detection test for SiC devices

  • Posted by Juan Moreno Echarri
  • On October 26, 2022
  • 0
Screening is paramount to achieving this SiC reliability level requested by all industries, and for some specific niche applications, special precautions should be taken into consideration.
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SiC Testing

Testing SiC Schottky Diodes for Heavy Ions Optimization

  • Posted by Juan Moreno Echarri
  • On August 9, 2022
  • 0
SiC Schottky diodes have certain limitations in terms of reverse voltage bias in heavy ions environments. However, they can still be the best option for certain very demanding operational conditions.
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EEE Components, PASSIVES, SiC Testing

SIC diodes versus Heavy Ions (SEE)

  • Posted by Juan Moreno Echarri
  • On February 5, 2022
  • 0
Even if there are known weaknesses of SiC Schottky diodes while being biased at high voltage in dense ions environments, they can still be the best option for certain very demanding operational conditions. The compatibility of these devices is analysed in this technical note.
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Optoelectronics, TESTING

GRACE PROJECT: Electrical Characterization at 500°C

  • Posted by Juan Moreno Echarri
  • On January 24, 2022
  • 0
Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.
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Optoelectronics, TESTING

Thermal Vacuum For HV Optocouplers – Video Monitoring

  • Posted by Juan Moreno Echarri
  • On January 12, 2022
  • 0
Laser screening tests are done to comply with users’ requirements; two different challenges must be addressed. First, high-power lasers (30watts in this case) require specific test setups and important safety considerations to avoid dangerous situations in case of DUT/setup failure.
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Optoelectronics Components Testing

Electrical characterization at 500ºC for GRACE project

  • Posted by Juan Moreno Echarri
  • On August 26, 2021
  • 0
The GRACE project is framed within the main challenges of our society, particularly safe, efficient, and clean energy, while connecting with aspects of security, safety, and defense, as well as climate change and efficiency in the use of resources raw materials.
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Optoelectronics Components Testing

Thermal vacuum with video monitoring for HV optocouplers

  • Posted by Juan Moreno Echarri
  • On July 5, 2021
  • 0
Exposure to vacuum may cause changes in filling isolating materials even at room temperature conditions. HV Optocouplers are used to connect two different circuits while maintaining high electrical isolation between them.
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ACTIVES, ALTER Projects, EEE Components

HEATPACK: Higher thermal dissipation in space systems

  • Posted by Juan Moreno Echarri
  • On June 29, 2021
  • 0
HEATPACK (High thErmAl efficiency componenTs PACKages for space) is the European effort to develop the next generation of low thermal resistance packages, in particular thanks to the implementation of state-of-the-art diamond-based composite materials and disruptive new heat sink solutions.
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ACTIVES, EEE Components, ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, Non-standard testing, TESTING

Silicon Carbide Diodes (SiC) for space applications

  • Posted by Juan Moreno Echarri
  • On December 12, 2019
  • 0
Silicon Carbide (SiC) presents many advantages over Silicon and even other wide band gap semiconductors, while maturity of the technology increases quickly
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