125 results found for MIL-STD-88

This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices...

This test method is performed to determine whether termination leads and other component parts can withstand the effects of the heat to which they will be subjected...

Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines

total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...

The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.

This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...

This method provides a test for determining the integrity of pin-grid type package leads by measuring the capability of the package leads to withstand an axial force.

HS1840ARH 16-channel. Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7, to a maximum...

total dose test of the HS-OP470ARH.Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7,to a...

The purpose of this test is to check the internal materials, construction, and workmanship of microcircuits for compliance with the requirements of the applicable...