MIL-STD-883, Method 3016 Electrical Test Method Standard for Microcircuits: Activation time verification
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This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices such as TTL, DTL, RTL, ECL, and MOS and establishes the procedure necessary to accomplish the required testing. This method will ensure that a specified capability is available a known time interval after application of power.
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MIL-STD-883, Method 3016
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