125 results found for MIL-STD-88
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the amount of electrical noise produced by the device under vibration.
DLA
Method
1 /
Active
This test method defines the procedure for testing integrated circuits under known test conditions for susceptibility to alpha induced errors.
DLA
Method
1 /
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to output leakage current...
DLA
Method
/
Active
The purpose of this test is to determine the resistance of the part to sudden exposure to extreme changes in temperature and the effect of alternate exposures to these...
DLA
Method
9 /
Active
Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines
Alert Documents
- /
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.
DLA
Method
/
Active
Environmental Test Method Standard for Microcircuits: Ionizing radiation (total dose) test procedure
This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...
DLA
Method
9 /
Active
This method provides a test for determining the integrity of pin-grid type package leads by measuring the capability of the package leads to withstand an axial force.
DLA
Method
4 /
Active
HS1840ARH 16-channel. Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7, to a maximum...
TD
/ 0
Active