460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This test procedure defines the requirements for measuring the dose rate response and upset threshold of packaged devices containing analog functions when exposed to...
DLA
Method
3 /
Active
The purpose of this test method is to determine compliance with the specified sample plan for semiconductor devices subjected to the specified conditions.
DLA
Method
/ A w/Change4
Active
The purpose of this test is to measure the thermal resistance of the device under the specified conditions. conditions.
DLA
Method
/ w/Change1
Active
Electronic and Electrical Component Parts: Voltage Coefficient of Resistance Determination Procedure
Certain types of resistors exhibit a variation of resistance with changes in voltage across the resistor. This is a measurable characteristic; a test to determine the...
DLA
Method
/
Active
This test is performed to determine the effectiveness of the seal of microelectronic devices.
DLA
Method
/
Active
The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of semiconductor devices and constituent materials to...
DLA
Method
4 / A w/Change4
Active
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to LOW level input load...
DLA
Method
1 /
Active
This method establishes the means for measuring MOSFET threshold voltage. This method applies to both enhancement-mode and depletion-mode MOSFETs, and for both silicon...
DLA
Method
/
Active
This test is performed to determine whether the design of the terminals and their method of attachment can withstand one or more of the applicable mechanical stresses...
DLA
Method
/
Active