461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the direct interterminal capacitance between specified terminals using specified electrical biases.
DLA
Method
/ w/Change1
Active
The purpose of this method establishes a basic test circuit for the purpose of determining the associated gain of a gallium arsenide field effect transistor (FET).
DLA
Method
/ w/Change1
Active
The purpose of this test method is to quantitatively measure the gas atmosphere inside a metal or ceramic hermetically-sealed device using mass spectrometry methods.
DLA
Method
10 /
Active
This test is performed to determine the effectiveness of the seal of component parts. The immersion of the part under evaluation into liquid at widely different...
DLA
Method
/
Active
The purpose of this test method is to verify that the markings will not become illegible on the semiconductor devices when subjected to solvents.
DLA
Method
7 / A w/Change4
Active
The purpose of this test method is to measure the switching time of the tunnel diode under the specified conditions.
DLA
Method
/ w/Change3
Active
The purpose of this test is to determine if the device is capable of blocking a forward voltage which is increasing at an exponential rate starting from zero without...
DLA
Method
2 / w/Change3
Active
The purpose of this test is to determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures, and the shock of...
DLA
Method
1 / A
Cancelled
This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices...
DLA
Method
1 /
Active
This test method is performed to determine whether termination leads and other component parts can withstand the effects of the heat to which they will be subjected...
DLA
Method
1 /
Active