461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to detect the presence of moisture trapped inside the microelectronic device package in sufficient quantity to adversely affect device...
DLA
Method
/
Active
The purpose of this method is to determine if a part, while operating, will ignite an ambient explosive atmosphere.
DLA
Method
/
Active
This test is conducted for the purpose of determining the resistance of a part to exposures at extremes of high and low temperatures, and to the shock of alternate...
DLA
Method
/
Active
The purpose of this test is to determine the ability of an electrical comector to withstand a specified acceleration force without damage detrimental to its specified...
DLA
Method
1 / A
Cancelled
The dielectric withstanding voltage test (also called high-potential, over potential, voltage-breakdown, or dielectric-strength test) consists of the application of a...
DLA
Method
/
Active
The purpose of this test method is to measure the quality factor (Q) of the device. By definition, Q expresses the ratio of reactance to effective resistance of the...
DLA
Method
1 / w/Change3
Active
The purpose of this test is to measure the forward-current transfer ratio of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the maximum frequency of oscillation for the device under the specified conditions.
DLA
Method
/ w/Change1
Active
The intermittent life test is performed for the purpose of determining a representative failure rate for microelectronic devices or demonstrating quality or...
DLA
Method
/
Active
The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of component parts and constituent materials to the...
DLA
Method
7 /
Active