460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Qualify TeamQuest Technology, Inc.as an additional site for Burn-in and Group C High Temp Operating Life Test (HTOL) processes for Military and Aerospace products...
Alert Documents
/ D
Active
The purpose of this test is to measure the output admittance of the field-effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such as capacitors and inductors.
DLA
Method
/
Active
This is an internal visual inspection for use in destructive physical analysis (DPA) procedures. The purpose of this destructive test is to examine devices opened for...
DLA
Method
1 /
Active
The purpose of this test is to measure the reverse blocking current under the specified conditions, using the dc method or the ac method, as applicable.
DLA
Method
1 / w/Change3
Active
High dose rate testing to 300 krad(Si) . Low dose rate testing to 150 krad(Si) . The high dose rate irradiations were done at 65 rad(Si)/s and the low dose rate work...
TD
/ 0
Active
The purpose of this test is to detect the presence of moisture trapped inside the microelectronic device package in sufficient quantity to adversely affect device...
DLA
Method
/
Active
The purpose of this method is to determine if a part, while operating, will ignite an ambient explosive atmosphere.
DLA
Method
/
Active
This test is conducted for the purpose of determining the resistance of a part to exposures at extremes of high and low temperatures, and to the shock of alternate...
DLA
Method
/
Active
The purpose of this test is to determine the ability of an electrical comector to withstand a specified acceleration force without damage detrimental to its specified...
DLA
Method
1 / A
Cancelled