461 results found for MIL-STD

The purpose of this test is to determine the effecrs of subjecting connectors or contacts to mating and unmating cycles simulating the expected life of such connectors.

The purpose of this test is to measure the input admittance of the device under the specified conditions.

This section describes detailed requirements for a DPA of commonly used switches. These requirements supplement the general requirements in section 4.

The purpose of this test is to simulate actual service usage by inducing low temperatures, and applying the test voltage at simulated altitudes.

This method established the means for measuring propagation delay of digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.

This method establishes the means of measuring the series impedance of the ground and power supply circuit pin configurations for packages used for complex, wide...

The purpose of this method is to define a technique for assuring a normal distribution for any test method listed in the 3000 or 4000 series of this standard. This...

This test is performed for the purpose of determining the ability of various parts to withstand shock of the same severity as that produced by underwater explosions,...

This section describes detailed requirements for a DPA of commonly used capacitors. These requirements supplement the general requirements in section 4.

The purpose of this test is to measure the direct-current (dc) resistance of resistors, electromagnetic windings of components, and conductors. It is not intended that...