461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the maximum frequency of oscillation for the device under the specified conditions.
DLA
Method
/ w/Change1
Active
The intermittent life test is performed for the purpose of determining a representative failure rate for microelectronic devices or demonstrating quality or...
DLA
Method
/
Active
The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of component parts and constituent materials to the...
DLA
Method
7 /
Active
The purpose of this test is to measure the ratio of ac output power to the ac input power (usually specified in dB) under specified large-signal conditions.
DLA
Method
/ w/Change1
Active
This test is performed for the purpose of determining the effects of subjecting electronic and electrical parts, which are actuated by rotational motion, to a number...
DLA
Method
/
Active
The purpose of this test is to visually inspect the internal materials, construction, and workmanship of hybrid, multichip and multichip module microcircuits.
DLA
Method
13 /
Active
The purpose of this test is to measure the ratio of the ac output power to the ac input power under the specified conditions (usually specified in dB) for small-signal...
DLA
Method
/ w/Change1
Active
This test procedure defines the requirements for measuring the dose rate response and upset threshold of packaged devices containing analog functions when exposed to...
DLA
Method
3 /
Active
The purpose of this test method is to determine compliance with the specified sample plan for semiconductor devices subjected to the specified conditions.
DLA
Method
/ A w/Change4
Active
Electronic and Electrical Component Parts: Voltage Coefficient of Resistance Determination Procedure
Certain types of resistors exhibit a variation of resistance with changes in voltage across the resistor. This is a measurable characteristic; a test to determine the...
DLA
Method
/
Active