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INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Voids on sealing area.

  • Posted by Pedro CARABIAS LÓPEZ
  • On February 10, 2020
  • 0

Voids on sealing area. Observation by X-Ray. Validation by Seal Test.

Voids on sealing area.

Further analysis may be necessary in order to confirm whether there are real voids on sealing area, as well to determine the hermeticity of components with designed internal cavities, despite not having whole sealing.

External Visual inspection provides the first warning about possible sealing area defects, even though this preliminary observation is not enough to confirm the fault.

Voids on sealing area

Would it be enough the sealing material applied at internal area in order to ensure the proper isolation between external and internal environments?

  • First point to answer this question:

X-Ray inspection is the non-invasive test that allows to assess part construction, where naked eye does not reach.

As an example, next images are showing external top, lateral and bottom views that belongs to a microcircuit with CCGA-624 package for space application under evaluation:

microcircuit with CCGA-624 package for space

microcircuit with CCGA-624

microcircuit - CCGA-624 package for space

Whereas X-ray image displays the real sealing material applied all around device perimeter:

X-ray image

  • Second point:

Seal Test is recommended to be carried out, both Fine Leak and Gross Leak. In this way, although X-Ray discloses a weak point, parts hermeticity will be validated by Seal Test successful outcomes.

Seal Test must be performed according applicable MIL/ ESCC Methods, which depends on each part family:

    • MIL-STD-883, Method 1014.13 (for integrated circuit components, and other families as specified)
    • MIL-STD-750, Method 1071.8 (for discrete families)
    • MIL-STD-202, Method 112 (for Tantalum Capacitors with cavity)
    • ESCC Basic Specification No. 21100 (test methods, conditions, procedures and requirements specified herein are closely based on hermetic seal tests specified in MIL-STD-750 and MIL-STD-883)

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Pedro CARABIAS LÓPEZ
Pedro CARABIAS LÓPEZ
Responsible for the quality assurance of EEE parts procured at Alter Technology
Pedro Carabias has a Licentiate Degree in Physics by the University of Seville and a Postgraduate Master´s Degree in Teaching of Physics and Chemistry by the University Pablo de Olavide.

Having joined Alter Technology in 2011, he is responsible for the quality assurance of EEE parts procured for the following ESA missions: JUICE, MPCV-Orion ESM, ESAIL, Solar Orbiter. Reporting the evaluation and screening actions in terms of quality incidences, searching how to sort out the issues with customers involved and laboratory staff in order to ensure that parts meet reliability requirements according to ESCC/MIL applicable quality standards.
Pedro CARABIAS LÓPEZ
Latest posts by Pedro CARABIAS LÓPEZ (see all)
  • Outgassing and Mating Test - May 6, 2020
  • Quality/reliability issues and detection on High Reliability Optocouplers - April 29, 2020
  • Voids on sealing area. - February 10, 2020
TAGS: EEE PARTS FINE LEAK EEE PARTS GROSS LEAK EEE PARTS HERMETICITY TEST EEE PARTS INTERNAL VISUAL INSPECTION EEE PARTS PROCUREMENT EEE PARTS QUALITY AND RELIABILITY ISSUES EEE PARTS SEAL TEST EEE PARTS X-RAY INCOMING INSPECTION

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