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  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
    • SMALL SATS
    • REPRESENTATIVE PROJECTS / PAPERS
  • Additional Services
    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
    • PENETRATION TEST
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Non-standard testing

Pyrotechnic Cable Cutter at Cryogenic Temperature

  • Posted by Carlos Fornell Arias
  • On January 18, 2023
  • 0
The design and development of the test setup has taken into consideration all the requirements of samples. In this case, we followed a reference document, MIL-STD-202, to be applicable in space usage.
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Non-standard testing, TESTING

ANGULAR SENSORS MEASUREMENTS

  • Posted by Alina Spuma,
  • On February 18, 2022
  • 0
Under ESA contract number 20945/07/NL/IA, Alter Technology developed test benches for the characterization and qualification testing of 16bit (0.01º accuracy) Contactless angular sensors prototypes for telecom satellites’ extended life mechanisms. Angular sensors (AS) are position devices that provide the displacement in angular degrees concerning a fixed point or an arbitrary reference. The central performances to be measured are accuracy, hysteresis, and measuring range. These parameters must be measured before, during, and after applying environmental treatment during the qualification test campaign.
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ALTER Laboratory Services, Non-standard testing

Image Sensors: Characterization according to the EMVA 1288 standard

  • Posted by Pawel Adamiec
  • On February 15, 2022
  • 0
The EMVA1288 standard let us to measure the crucial parameters of the image sensors and cameras converting the physical model of the camera (image sensor) to the mathematical model, where the parameters can be extracted.
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Optoelectronics, TESTING

Lasers Endurance Characterization in Vacuum Conditions – Test Setup

  • Posted by Alejandro López Moya
  • On January 25, 2022
  • 0
Laser diodes characterization can be hard due to the laser’s nature. In the case of lasers, perfect control of current and temperature applied is mandatory. In addition, a good heat dissipation must be provided to avoid lasers being damaged. Special and complex equipment is required for a perfect characterization because accuracy is a must with thi
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Optoelectronics, TESTING

GRACE PROJECT: Electrical Characterization at 500°C

  • Posted by Juan Moreno Echarri
  • On January 24, 2022
  • 0
Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.
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Optoelectronics, TESTING

Calibration Sources in Vacuum Conditions

  • Posted by Alejandro López Moya
  • On January 13, 2022
  • 0
Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.
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Non-standard testing

Angular Sensors Measurements in Vacuum and Temperature

  • Posted by Alina Spuma,
  • On December 1, 2021
  • 0
A typical qualification campaign for space applications comprises environmental tests like thermal cycling and vacuum temperature test.
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Non-standard testing

Cryogenic 4K Capacitors Thermal Test

  • Posted by doEEEt Media Group
  • On November 30, 2021
  • 0
The lowest cryogenic temperatures achievable with liquid nitrogen systems are 77K. To lower temperatures further, it is necessary to use other systems. Helium cryostats can use this noble gas to cool a plate and reach temperatures of 4K. All these processes must be done in a vacuum since the air doesn’t allow the temperature.
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EEE Components, PASSIVES

Temperature/DC Bias MLCC Models for SPICE Simulations

  • Posted by doEEEt Media Group
  • On November 5, 2021
  • 0
Taiyo Yuden provides various component libraries for microwave circuits, PI, and SI simulators. The recent release add long-time wished temperature/DC Bias Models on MLCC capacitors for HSPICE and Spectre simulations.
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Non-standard testing

Characterization of Strain Gages at Harsh Environments

  • Posted by Juan Barbero
  • On October 8, 2021
  • 0
The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets.
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