- Posted by doEEEt Media Group
- On March 6, 2020
Some background information about BMTI will be introduced. 1. Using built-in self-test (BIST) structures for SEE test BIST structures, scan chains and memory-BIST, are used in SEE hardness assurance of BMTI’s IC products. The basic principle, consideration and skills will be given. Some implications for SEE assurance will be discussed.