ACTIVES, EEE Components, ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, Non-standard testing, TESTING

SiC Schottky Blocking Diode for BepiColombo Solar Array

Posted by doEEEt Media Group
On December 10, 2020
0

Alter Technology as reference test house Screening of a high number of devices under very harsh conditions: Custom testing setup High Temperature: 270ºC Low temp: -170ºC High Voltage tests: 250V High Power tests: 2.5A Long lasting tests with constant monitoring of electrical parameters and temperature of each single diode.

ACTIVES, EEE Components, PASSIVES, RF & MW, SPECIFICATIONS / QPLs

Issue 204 of ESCC QUALIFIED PART LIST (QPL)

Posted by Emilio Cano García
On March 17, 2020
0

The changes in issue 204 of ESCC QUALIFIED PART LIST (QPL) are included in the DCR 1325 and detailed herein below

ACTIVES, EEE Components, ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, Non-standard testing, TESTING

Silicon Carbide Diodes (SiC) for space applications

Posted by Juan Moreno Echarri
On December 12, 2019
0

Silicon Carbide (SiC) presents many advantages over Silicon and even other wide band gap semiconductors, while maturity of the technology increases quickly

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