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Non-standard testing, TESTING

ANGULAR SENSORS MEASUREMENTS

  • Posted by Alina Spuma,
  • On February 18, 2022
  • 0
Under ESA contract number 20945/07/NL/IA, Alter Technology developed test benches for the characterization and qualification testing of 16bit (0.01º accuracy) Contactless angular sensors prototypes for telecom satellites’ extended life mechanisms. Angular sensors (AS) are position devices that provide the displacement in angular degrees concerning a fixed point or an arbitrary reference. The central performances to be measured are accuracy, hysteresis, and measuring range. These parameters must be measured before, during, and after applying environmental treatment during the qualification test campaign.
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Non-standard testing, TESTING

THERMAL CYCLING ILLUMINATED PHOTODIODES

  • Posted by José Luis Corral Castillo
  • On February 18, 2022
  • 0
160 ILLUMINATED PHOTODIODES Development of a complex setup capable of simultaneously measuring 20 solar sensors under homogeneous incident light During the last decades, continuous technology improvement has allowed the development of increasingly smaller and cheaper satellites. Different private companies figured out this fact and started to think about the possibilities of having their satellite constellation.
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Optoelectronics, TESTING

IR SOURCES THERMAL VACUUM CYCLING CHARACTERIZATION

  • Posted by Alejandro López Moya
  • On February 11, 2022
  • 0
Thermal Vacuum Testing is necessary to be carried out because the environmental conditions in the space are extreme, the combination of low pressure and extreme temperatures can cause the failure of a component. That is why in Alter Technology, we test the components in similar conditions.
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Optoelectronics, TESTING

Photonic Integrated Circuits Radiation

  • Posted by David Poudereux Sánchez
  • On January 31, 2022
  • 0
ALTER is performing gamma and proton radiation at various PICs. The satellite market is experiencing a paradigm shift with the photonics penetration in every part of the satellite payload. Although some advances have been done with the introduction of optical interconnects in a commercial digital processor of a satellite payload
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Optoelectronics, TESTING

Evaluation of Optical switches without moving parts

  • Posted by David Poudereux Sánchez
  • On January 27, 2022
  • 0
The most relevant result of this work is that all tested samples passed satisfactory the test without relevant changes in the measured parameters, with the exception of one of the WG-EO switches which had a catastrophic failure, as it will be commented later. The pass/non-pass criteria were defined comparing the results of the electro-optical characterization after each test with the corresponding results for each parameter prior to the tests, taking into account the measurement uncertainty.
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Optoelectronics, TESTING

Lasers Endurance Characterization in Vacuum Conditions – Test Setup

  • Posted by Alejandro López Moya
  • On January 25, 2022
  • 0
Laser diodes characterization can be hard due to the laser’s nature. In the case of lasers, perfect control of current and temperature applied is mandatory. In addition, a good heat dissipation must be provided to avoid lasers being damaged. Special and complex equipment is required for a perfect characterization because accuracy is a must with thi
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Optoelectronics, TESTING

GRACE PROJECT: Electrical Characterization at 500°C

  • Posted by Juan Moreno Echarri
  • On January 24, 2022
  • 0
Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.
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Optoelectronics, TESTING

Calibration Sources in Vacuum Conditions

  • Posted by Alejandro López Moya
  • On January 13, 2022
  • 0
Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.
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