Lunar Regolith Test onto COTS Optoelectronics
- Posted by Juan Moreno Echarri
- On January 18, 2023
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Introducing the usage in planetary exploration as illumination of surface in robotic lunar exploration needs new testing techniques. Commercial LEDs are available in many packages, most SMD mounting and, in many cases, finished with a silicone glob top. The degradation caused by lunar regolith exposure onto all these options is unknown and shall be assessed by testing.
RF Testing – Radio Frequency
- Posted by Aintzane Lujambio Genua
- On April 24, 2019
- 0
Screening activities for space applications require extreme care during the manipulation of the EEE parts to be assembled on a spacecraft. This means that special attention must be paid to avoid damage to the parts, as well as any contamination by foreign materials.
Lasers Endurance Characterization in Vacuum Conditions – Test Setup
- Posted by Alejandro López Moya
- On January 25, 2022
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Laser diodes characterization can be hard due to the laser’s nature. In the case of lasers, perfect control of current and temperature applied is mandatory. In addition, a good heat dissipation must be provided to avoid lasers being damaged. Special and complex equipment is required for a perfect characterization because accuracy is a must with thi
Lead Integrity Test, How to be perform
- Posted by Jesús Enrique Barbero Muñoz
- On October 15, 2021
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Lead integrity test is performed to determine the integrity of the device leads (terminals), welds and seals. During the execution of this test, the DUT is subjected to various stresses including tension, bending fatigue and torque. The stresses to be applied depend on the DUT characteristics and on the corresponding test method.
Evaluation of Optical switches without moving parts
- Posted by David Poudereux Sánchez
- On January 27, 2022
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The most relevant result of this work is that all tested samples passed satisfactory the test without relevant changes in the measured parameters, with the exception of one of the WG-EO switches which had a catastrophic failure, as it will be commented later. The pass/non-pass criteria were defined comparing the results of the electro-optical characterization after each test with the corresponding results for each parameter prior to the tests, taking into account the measurement uncertainty.
Prototyping and Characterization of 1200V Schottky SiC Diode
- Posted by doEEEt Media Group
- On November 25, 2021
- 0
The study will be focused on the development of high voltage SiC Schottky diode in a package suitable for space application with the primary goal to characterize the performances of the devices in terms of switching capability, reliability of the technology, and preliminary characterization of static and dynamic parameters as a function of temperatures as well as to characterize the thermal impedance and resistance of the proposed package solution.
Lot Acceptance Test (LAT)
- Posted by Alejandro López Moya
- On June 28, 2021
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A Lot Acceptance Test (LAT) is a reduced set of Qualification tests over components or equipment, required to accept a specific manufacturing lot for its use. A LAT sequence allows customers to have complete traceability of the components they are going to use in their application, starting from the wafer used during manufacturing.
Total Ionizing Dose (TID) testing, Update on ESCC22900
- Posted by doEEEt Media Group
- On February 14, 2020
- 0
Total Ionizing Dose (TID) testing, Update on ESCC22900 and discussion on TID response variability (part to part and lot to lot) and impact on sampling size and test requirements
Advances in Packaging and EEE Components
- Posted by doEEEt Media Group
- On February 24, 2020
- 0
Focusing on all aspects related to the usage of Commercial of the Shelf (COTS) Electrical, Electronic and electro-mechanical (EEE) parts in space applications. Although the main goal is to address the specific needs of “New Space” programs such as constellations and /or nano & small satellites, the workshop will cover also classical space missions.