460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Aeroflex is proceeding with migrating the UT63M147 MIL-STD-1553A/B Bus Transceivers (5962-93226), to a new wafer fabrication facility. As a result of the wafer foundry...
Alert Documents
18/07/2018 /
Active
This test defines the basic test circuitry and waveform definitions by which to measure the total switching losses of an IGBT.
DLA
Method
1 / w/Change1
Active
This method establishes the means for measuring the output transition times of digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
DLA
Method
1 /
Active
The purpose of this test is to measure the real part of the impedance at the IF output terminals of the mixer diode under test.
DLA
Method
1 / w/Change3
Active
This section describes detailed requirements for a DPA of commonly used resistors. These requirements supplement the general requirements in section 4.
DLA
Method
/ C
Active
The purpose of this method establishes a basic test circuit for the purpose of establishing forward transconductance gm for gallium arsenide field effect transistors.
DLA
Method
/ w/Change1
Active
The purpose of this test is to determine the integrity of the seal of the shell/insert/contact interfaces in a electrical connector.
DLA
Method
/ A
Cancelled
This test determines the ability of component parts and subassemblies of electrical and electronic components to withstand shocks.
DLA
Method
/
Cancelled
This method establishes the procedure for measuring the ground bounce (and VCC bounce) noise in digital microelectronic devices or to determine compliance with...
DLA
Method
/
Active
The purpose of this test is to determine the degradation to the test connector when subjected to stresses similar to those which may be expected by inserting and...
DLA
Method
1 / A
Cancelled