460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the voltage between the collector and emitter of the device under specified conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
DLA
Detail / Drawing
J / -
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this test is to evaluate existing SWR of connectors, coaxial, radio frequency.
DLA
Method
/ A
Cancelled
Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines
Alert Documents
- /
Active
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor or IGBT under the specified static condition.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the pulse response (td, tr, ts, and tf) of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The vibration test is used to determine the effects on component parts of vibration within the predominant frequency ranges and magnitudes that may be encountered...
DLA
Method
/
Active