460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method provides means for establishing or evaluating the maximum capabilities of microelectronic devices, including such capabilities as absolute maximum ratings...
DLA
Method
/
Active
The purpose of this test is to measure the SWR of the device at the local oscillator terminals.
DLA
Method
1 / w/Change3
Active
This method provides a test for determining the integrity of solder column type package leads by measuring the capability of the package column to withstand an axial...
DLA
Method
/
Active
The purpose of this test is to define a method for verifying the inductive switching SOA for MOS gated power transistors and to assure devices are free from latch up.
DLA
Method
/ w/Change1
Active
The purpose of this test is to determine if the breakdown voltage of the device under the specified conditions is greater than the specified minimum limit.
DLA
Method
2 / w/Change1
Active
The purpose of this test is to measure the static transconductance of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
2 / w/Change1
Active
The purpose of this test is to measure the saturation voltage and resistance of the device under the specified conditions.
DLA
Method
/ w/Change1
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this test is to evaluate existing SWR of connectors, coaxial, radio frequency.
DLA
Method
/ A
Cancelled