MIL-STD-883, Method 3024 Electrical Test Method Standard for Microcircuits: Simultaneous switching noise measurements for digital microelectronic devices
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This method establishes the procedure for measuring the ground bounce (and VCC bounce) noise in digital microelectronic devices or to determine compliance with specified ground bounce noise requirements in the applicable acquisition document.
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16/09/2019 0:00:00
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MIL-STD-883, Method 3024
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