460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This test method is performed for the purpose of detecting malfunctions of semiconductor devices during vibration in the specified frequency range at the specified...
DLA
Method
4 / A w/Change5
Active
The purpose of this test is to measure the value of the small signal series inductance under the specified conditions.
DLA
Method
/ w/Change3
Active
The purpose of this test method is to determine the solderability of all ribbon leads up to 0.050 inch (1.27 mm) in width and up to 0.025 inch (0.64 mm) in thickness...
DLA
Method
3 /
Active
The purpose of this test method is to determine the solderability of all terminations which are normally joined by a soldering operation.
DLA
Method
A /
Active
The purpose of this test is to determine the thermal performance of diode devices. This can be done in two ways, steady-state thermal impedance or transient thermal...
DLA
Method
5 / w/Change1
Active
The purpose of this test method is to measure the static characteristics (Vp, Vv, Ip, Iv, VFP, and Rd) of the tunnel diode under the specified conditions
DLA
Method
1 / w/Change3
Active
This method establishes the means for measuring the automatic gain control range of a linear amplifier.
DLA
Method
/
Active
Method 5008 is canceled effective 1 June 1993. It is superseded by MIL-PRF-38534. For Federal Stock classes other than 5962, the following paragraphs of MIL-PRF-38534...
DLA
Method
9 /
Cancelled
The purpose of this test is to determine the time required for the DUT to switch off when a reverse bias is applied after the DUT has been forward biased and to...
DLA
Method
1 / w/Change1
Active
The purpose of this test is to determine the effectiveness of circular jacketed cable to plug interface, or flat cable to plug interface to withstand strain under...
DLA
Method
/ A
Cancelled