MIL-STD-750, Method 3490 Transistor Electrical Test Methods for semiconductor Devices Part 3: Clamped inductive switching safe operating area for MOS gated power transistors
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The purpose of this test is to define a method for verifying the inductive switching SOA for MOS gated power transistors and to assure devices are free from latch up.
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09/12/2019 0:00:00
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MIL-STD-750, Method 3490
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