MIL-STD-750, Method 1015 Environmental Test Methods for Semiconductor Devices Part 1: Steady–state primary photocurrent irradiation procedure (electron beam)
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This test method establishes the means for measuring the steady-state primary photocurrent (IPH) generated in semiconductor devices when these devices are exposed to ionizing radiation.
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MIL-STD-750, Method 1015
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MIL-STD-750, Method 1015
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