125 results found for MIL-STD-88

This method establishes the requirements for the lot acceptance testing of microcircuit wafers intended for class level S use.

This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality conforms with the...

The purpose of this test method is to quantitatively measure the gas atmosphere inside a metal or ceramic hermetically-sealed device using mass spectrometry methods.

This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices...

This test method is performed to determine whether termination leads and other component parts can withstand the effects of the heat to which they will be subjected...

This test is conducted for the purpose of determining the ability of the microcircuit; to withstand the dynamic stress exerted by random vibration applied between...

This method specifies wafer fabrication control and wafer acceptance requirements for GaAs monolithic microcircuits for application in class level B or class level S...

Failure analysis is a post mortem examination of failed devices employing, as required, electrical measurements and many of the advanced analytical techniques of...

This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to HIGH level output drive,...

This method establishes screening procedures for total lot screening of microelectronics to assist in achieving levels of quality and reliability commensurate with the...