ACTIVES, COTS, New Space, LEO Constellations, EEE Components

Microchip: Hirel Plastic Rad Tolerant (HP) products

Posted by Manuel Padial Pérez
On March 14, 2020
0

Microchip takes a proven automotive-qualified device and improves the silicon process to make the component immune to single-event latch-up in heavy ions, thus preventing destruction in the radiation environment of space.

ALTER Laboratory Services, ENDURANCE, ENVIRONMENTAL & RADIATION

Burn-in Test Features

Posted by Antonio Amigo
On February 14, 2020
0

Is an electrical stress test that typically employs voltage and/or temperature to accelerate the appearance of latent reliability defects in a device. The objective of burn-in is to eliminate all potential failure likely to occur at the early phase of the product life time (also called Infant Mortality Failure). It can easily be observed in a typical reliability bath tub curve as shown below.

ACTIVES, COTS, New Space, LEO Constellations, EEE Components

KEMET: High Reliability Alternative (HRA) SERIES

Posted by Manuel Padial Pérez
On November 25, 2019
0

In addition to the Automotive, MIL-PRF and Space grade series, these are the Kemet proposal to address High Reliability Applications

Page 2 of 212