460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this test is to evaluate existing SWR of connectors, coaxial, radio frequency.
DLA
Method
/ A
Cancelled
Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines
Alert Documents
- /
Active
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor or IGBT under the specified static condition.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the pulse response (td, tr, ts, and tf) of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The vibration test is used to determine the effects on component parts of vibration within the predominant frequency ranges and magnitudes that may be encountered...
DLA
Method
/
Active
This test is conducted for the purpose of determining the ability of component parts to withstand the dynamic stress exerted by random vibration applied between upper...
DLA
Method
/
Active
This test method is performed to determine whether semiconductor device terminations can withstand the effects of the heat to which they will be subjected during the...
DLA
Method
5 / A w/Change5
Active
The purpose of this test is to determine the ability of a connector to withstand impacts of the type that might be encountered when a connector is uncoupled and...
DLA
Method
/ A
Cancelled
The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.
DLA
Method
/
Active