461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test finds out the length of time a device can survive a short-circuit condition. In some circuits, such as motor drives, it is necessary for a...
DLA
Method
/ w/Change1
Active
The purpose of this test method is to determined compliance with the specified lambda for semiconductor devices subjected to the specified conditions.
DLA
Method
5 / A w/Change4
Active
The purpose of this test is to determine the ability of a connector to withstand a load that might be encountered when run over by a wheeled vehicle.
DLA
Method
1 / A
Cancelled
Method 2008 is canceled effective 15 November 1974
DLA
Method
1 /
Supersed
The purpose of this test is to determlne the adequacy of the insert retaining mechanism and the strength of the insert material in electrical connectors and...
DLA
Method
1 / A
Cancelled
The variable frequency vibration test is performed for the purpose of determining the effect on component parts of vibration in the specified frequency range. This is...
DLA
Method
3 /
Active
This test is proposed as an accelerated laboratory corrosion test simulating the effects of seacoast atmosphere on devices and package elements.
DLA
Method
8 /
Active
The purpose of this test is to demonstrate the ability of the connector-to-wire and interface-area seals of a mated connector assembly to perform satisfactorily during...
DLA
Method
1 / A
Cancelled
The purpose of this test is to determine the Gate Equivalent Series Resistance (ESR) of MOSFET devices. This can be done in two ways, using either manual test circuit...
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the output admittance of the device under the specified conditions.
DLA
Method
/ w/Change1
Active