MIL-STD-750, Method 3479 Transistor Electrical Test Methods for semiconductor Devices Part 3: Short-circuit withstand time
General data
The purpose of this test finds out the length of time a device can survive a short-circuit condition. In some circuits, such as motor drives, it is necessary for a semiconductor device to withstand a short-circuit condition for short periods of time.
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MIL-STD-750, Method 3479
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