461 results found for MIL-STD

This method establishes the means of measuring the level of cross-coupling of wideband digital signals and noise between pins in a digital microcircuit package.

The purpose of this test is to inspect passive elements used for microelectronic applications, including RF/microwave, for the visual defects described herein.

This method establishes the means for assuring device performance to the limits specified in the applicable acquisition document in regard to input and output...

The purpose of this test is to measure the shunt capacitance of the input terminals of the device under the specified conditions.

This test method is an accelerated laboratory corrosion test simulating the effects of seacoast atmospheres on semiconductor devices.

This test method establishes a procedure for performing dielectric withstanding voltage test (also called high-potential, over potential, voltage breakdown, or...

The purpose of this test is to determine the electrical conduction of the connector shell under simulated service conditions.

This describes a test method for subjecting the device under test (DUT) to a high power stress condition in the reverse direction of rectifiers to determine the...

The purpose of this test is to determine the forces required to engage and separate standard test pins or blade with individual contacts

The purpose of this test method is to determine the effectiveness of the seal of a component part which has an internal cavity which is either evacuated or contains...