Using Cavity Filters for High Precision and Reliability in Narrow Band

Posted by doEEEt Media Group
On March 10, 2020
0

Many microwave applications, such as repeaters, and electronic warfare equipment, require increased spectral resolution. This means these devices only need to look at a narrow slice of a given band.

EEE Components, PASSIVES

University College London Developed Fast-charging, Long-running, Bendable Supercapacitors

Posted by doEEEt Media Group
On March 9, 2020
0

While the supercapacitor developed by the team has a comparable energy density to state-of-the-art value of lead-acid batteries, its power density is two orders of magnitude higher at over 10,000 Watt per litre.

EEE Components, Non-standard testing

Fibers Elongation: methods and solutions

Posted by doEEEt Media Group
On March 9, 2020
0

Optical fibers are delicate elements that can break easily, and their repair is not as simple as an electric wire. The optical fibers suffer great stress in the outdoor installations due to weather conditions and the installation itself.

EEE Components, PASSIVES

DC-AC Bias Dependence of MLCC Capacitors

Posted by doEEEt Media Group
On March 6, 2020
0

The capacitance of certain capacitors depends not only on the chosen dielectric material, geometry and temperature but also on the DC and AC bias applied to the part

ALTER Innovation, ALTER Projects

Remote Testing – New approach for Space

Posted by doEEEt Media Group
On March 6, 2020
0

Alter Technology is helping to shorten the cost and schedule of space programmes, providing to the final customer fast test-design records, real-time progress status, and result feedback.

ALTER Innovation, ALTER Projects

Radiation Test experience at BMTI

Posted by doEEEt Media Group
On March 6, 2020
0

Some background information about BMTI will be introduced. 1. Using built-in self-test (BIST) structures for SEE test BIST structures, scan chains and memory-BIST, are used in SEE hardness assurance of BMTI’s IC products. The basic principle, consideration and skills will be given. Some implications for SEE assurance will be discussed.

MANUFACTURER NOTIFICATION

Murata Completes New Production Facility for Chip Inductors, Noise Filters, and Common Mode Choke Coils

Posted by doEEEt Media Group
On February 27, 2020
0

Murata Completes New Production Facility for Chip Inductors, Noise Filters, and Common Mode Choke Coils

EEE Components, PASSIVES

Rising Price of Palladium Could Impact High-Reliability MLCC Markets in 2020

Posted by doEEEt Media Group
On February 27, 2020
0

Palladium’s price has exhibited extreme volatility since 2012, with continual rises in price from August 2019 through January 2020. The price hit its 25-year high in January 2020 which created short-term forecasts suggesting an increase in production costs for speciality MLCCs. Further rises in price are expected in 2020

ALTER Projects

SILICON CAPACITORS SPACE Pre-Evaluation

Posted by doEEEt Media Group
On February 25, 2020
0

Due to these excellent characteristics for Space applications and with the aim of a possible qualification for Space commercial use, an evaluation of different family IPDIA silicon capacitors such as HSSC, LPSC and EXSC IPDIA silicon capacitors was carried out by Alter Technology.

ALTER Innovation, ALTER Projects

Assessing Radiation Hardness of SIC MOS Structures

Posted by doEEEt Media Group
On February 24, 2020
0

SEE testing of the lateral MOS revealed no sensitivity of the devices to heavy ions. A possible explanation for this could be that damage in vertical DMOS is mainly located in the JFET area between p-wells which is submitted to higher electric fields.

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