460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality conforms with the...
DLA
Method
17 /
Active
The purpose of this test is to measure the gate charge (Qg) of power MOSFETs and IGBT.
DLA
Method
3 / w/Change1
Active
This test is performed for the purpose of determining the flammability of a part exposed to an external flame. Flammability is defined as the ability of a part to...
DLA
Method
/
Active
The purpose of this test is to measure the direct interterminal capacitance between specified terminals using specified electrical biases.
DLA
Method
/ w/Change1
Active
The MFR performed a internal qualification in accordance with MIL-PRF-38534 Element Evaluation. Testing was performed per MIL-STD-750. No form, fit or function will be...
Alert Documents
- /
Active
The purpose of this method establishes a basic test circuit for the purpose of determining the associated gain of a gallium arsenide field effect transistor (FET).
DLA
Method
/ w/Change1
Active
The purpose of this test method is to quantitatively measure the gas atmosphere inside a metal or ceramic hermetically-sealed device using mass spectrometry methods.
DLA
Method
10 /
Active
This test is performed to determine the effectiveness of the seal of component parts. The immersion of the part under evaluation into liquid at widely different...
DLA
Method
/
Active
The purpose of this test method is to verify that the markings will not become illegible on the semiconductor devices when subjected to solvents.
DLA
Method
7 / A w/Change4
Active
The purpose of this test method is to measure the switching time of the tunnel diode under the specified conditions.
DLA
Method
/ w/Change3
Active