460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
DLA
Detail / Drawing
J / -
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document with regard to LOW level output drive...
DLA
Method
1 /
Active
The purpose of this test method is to determine compliance with the specified lambda for semiconductor devices subjected to the specified conditions.
DLA
Method
1 / A w/Change4
Active
This test describes a means to cause current to flow alternately through the legs of a single-phase or three-phase bridge assembly under conditions to make it feasible...
DLA
Method
1 / w/Change1
Active
The variable-frequency-vibration test method is performed for the purpose of determining the effect on semiconductor devices of vibration in the specified frequency...
DLA
Method
3 / A w/Change5
Active
The purpose of this test is to determine the effects of vibration within the predominant or random vibration frequency ranges and magnitudes that may be encountered...
DLA
Method
2 / A
Cancelled
The purpose of this test is to determine the extrapolated unity-gain frequency (gain-bandwidth product) of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
This test procedure specifies the methods by which fault coverage is reported for a test program applied to a microcircuit herein referred to as the device under test...
DLA
Method
1 /
Active
The purpose of this test is to determine the effect on microelectronic devices of storage at elevated temperatures without electrical stress applied.
DLA
Method
2 /
Active