MIL-STD-883, Method 3007 Electrical Test Method Standard for Microcircuits: Low level output voltage

This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document with regard to LOW level output drive which is specified as a maximum value (VOL max) or a minimum value (VOL min). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.