MIL-STD-750, Method 3473 Transistor Electrical Test Methods for semiconductor Devices Part 3: Reverse recovery time (trr) and recovered charge (qrr)for power mosfet (drain-to-source) and power rectifiers with trr ≤100 ns
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The purpose of this test is to determine the time required for the DUT to switch off when a reverse bias is applied after the DUT has been forward biased and to determine the charge recovered under the same conditions.
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MIL-STD-750, Method 3473
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