Logo
  • Resources
    • COTS for Space WEBINARS
    • ACCEDE 2022 Workshop on COTS
    • EEE COMPONENTS
    • SPECIFICATIONS / QPLs
    • EVENTS / WEBINARS
    • SPACE TALKS
    • TECH ARTICLES
    • MANUFACTURERS NOTIFICATIONS
  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
    • SMALL SATS
    • REPRESENTATIVE PROJECTS / PAPERS
  • Additional Services
    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
    • PENETRATION TEST
    • CYBERSECURITY CERTIFIED (CSC)
    • CODE SCORE MATRIX
    • LONG-TERM STORAGE OF WAFERS
    • ELECTRONIC DESIGN
  • Tools
    • COMPARATOR
    • MY DCLs/BOMs
    • STOCKPLACE
  • About Us
  • My Request
  • Sign In
  • Resources
    • COTS for Space WEBINARS
    • ACCEDE 2022 Workshop on COTS
    • EEE COMPONENTS
    • SPECIFICATIONS / QPLs
    • EVENTS / WEBINARS
    • SPACE TALKS
    • TECH ARTICLES
    • MANUFACTURERS NOTIFICATIONS
  • Laboratory Services
    • LABORATORY STANDARD TESTING
    • NON STANDARD TESTING
    • SILICON CARBIDE -SiC- DIODES
    • CROWDTESTING
    • OPTOELECTRONICS
    • SMALL SATS
    • REPRESENTATIVE PROJECTS / PAPERS
  • Additional Services
    • INDUSTRY 4.0 CYBERSECURITY (IEC 62443)
    • PENETRATION TEST
    • CYBERSECURITY CERTIFIED (CSC)
    • CODE SCORE MATRIX
    • LONG-TERM STORAGE OF WAFERS
    • ELECTRONIC DESIGN
  • Tools
    • COMPARATOR
    • MY DCLs/BOMs
    • STOCKPLACE
  • About Us
  • My Request
  • Sign In
Blog Image
Optoelectronics Components Testing

Lasers endurance characterization in vacuum conditions

  • Posted by Alejandro López Moya
  • On July 6, 2021
  • 0
Laser diodes characterization can be complex due to the laser’s nature. A good heat dissipation must be provided to avoid lasers being damaged. Unique and challenging equipment is required for a perfect characterization because accuracy is a must with this optical component. The real challenge? The test setup definition and implementation when lasers must be tested in extreme conditions, like vacuum or high/low temperatures.
Read More
Blog Image
ALTER Laboratory Services, Optoelectronics Components Testing

Lot Acceptance Test (LAT)

  • Posted by Alejandro López Moya
  • On June 28, 2021
  • 0
A Lot Acceptance Test (LAT) is a reduced set of Qualification tests over components or equipment, required to accept a specific manufacturing lot for its use. A LAT sequence allows customers to have complete traceability of the components they are going to use in their application, starting from the wafer used during manufacturing.
Read More
Blog Image
ACTIVES, EEE Components

Parts Approval Document (PAD). EEE components testing.

  • Posted by Juanjo Medina
  • On May 7, 2020
  • 0
Parts Approval Document (PAD) is a control paper whose purpose is to identify unequivocally the component and to provide information about its evaluation and its acceptability regarding to six steps
Read More
Recent Posts
  • New ECSS-Q-ST-60C Standards Explained- Discover
  • Accelerating Space Missions: Launch Faster with the ZSOM-F01 Rad-Tolerant SoM
  • Miniature RF Connectors
  • Miniature RF Connectors for high-performance testing
  • Space-Grade components available for immediate delivery
Scroll

doEEEt.com

DoEEEt: Electrical Electronic Electromechanical (EEE) parts database. Find (EEE) components/parts products and datasheets from hundreds of manufacturers.

Privacy Policy and Legal Notice

Copyright

Cookie Policy

Copyright © 2021 ALTER TECHNOLOGY TÜV NORD S.A.U

Company

About us

Contact us

How does doEEEt works? – FAQ

ALTER Laboratory Services

Microwave and RF Testing

Small Sats Testing

COTS components Testing

Authenticity Test