125 results found for MIL-STD-883
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to determine the effect on the device of vibration in the frequency range specified.
DLA
Method
2 /
Active
This method establishes the requirements for the lot acceptance testing of microcircuit wafers intended for class level S use.
DLA
Method
8 /
Active
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality conforms with the...
DLA
Method
17 /
Active
The purpose of this test method is to quantitatively measure the gas atmosphere inside a metal or ceramic hermetically-sealed device using mass spectrometry methods.
DLA
Method
10 /
Active
This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices...
DLA
Method
1 /
Active
This test method is performed to determine whether termination leads and other component parts can withstand the effects of the heat to which they will be subjected...
DLA
Method
1 /
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines
Alert Documents
- /
Active
The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.
DLA
Method
/
Active
Environmental Test Method Standard for Microcircuits: Ionizing radiation (total dose) test procedure
This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...
DLA
Method
9 /
Active