14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
E / -
Active
MNFR
Detail / Drawing
- / -
Active
DLA
Detail / Drawing
D / -
Active
MNFR
Detail / Drawing
4.00 / -
Active
DLA
Detail / Drawing
G / w/Amend. 3
Active
The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of semiconductor devices and constituent materials to...
DLA
Method
4 / A w/Change4
Active
DLA
Detail / Drawing
E / -
Active
MNFR
Detail / Drawing
C / -
Active
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active