MIL-STD-750, Method 1021 Environmental Test Methods for Semiconductor Devices Part 1: Moisture resistance
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The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of semiconductor devices and constituent materials to the deteriorative effects of the high humidity and heat conditions typical of tropical environments.
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MIL-STD-750, Method 1021
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MIL-STD-750, Method 1021
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