14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
JAXA
Detail / Drawing
A / -
Active
MNFR
Detail / Drawing
0 / -
Active
The base HS-26C32RH is acceptance tested on a wafer-by-wafer basis to 300krad(Si) at High Dose Rate (HDR) (50–300rad(Si)/s). At LDR, (0.01rad(Si)/s maximum). The...
TD
/ 0.00
Active
DLA
Generic
E / w/Amend. 3
Active
DLA
Generic
F / -
Active
MNFR
Detail / Drawing
C / -
Active
Parts were tested at low and high dose rate under biased and unbiased conditions at 0.01 rad(Si)/s and 65 rad(Si)/s respectively. The low dose rate test was run to 50...
TD
/ 0.00
Active
DLA
Detail / Drawing
- / w/Amendment 5
Active