AN1949 Total ionization ISL70419SEH

Parts were tested at low and high dose rate under biased and unbiased conditions at 0.01 rad(Si)/s and 65 rad(Si)/s respectively. The low dose rate test was run to 50 krad(Si) and will be extended to 100 krad(Si); the high dose rate test was run to 450 krad(Si). Anneals were performed after 50 krad(Si) of low dose rate irradiation on half